skip to main content

Title: Hard x-ray nanofocusing using total-reflection zone plates

A total-reflection zone plate (TRZP), which is a reflective grating that generates a line focus of hard X-rays, was developed. Newly designed TRZPs, introducing a laminar grating concept, were fabricated with various zone parameters. The focusing performances with regard to the beam size and the diffraction efficiency were evaluated using synchrotron radiation X-rays of 10 keV energy. Although the beam sizes measured are insufficient in comparison with the ideal value, the maximum diffraction efficiency, measured at 20%, exceeds the limitations of conventional TRZPs based on a binary grating.
Authors:
; ; ; ;  [1] ;  [2]
  1. Center for Novel Material Science under Multi-Extreme Conditions, Graduate School of Material Science, University of Hyogo, Kamigori, Hyogo 678-1297 (Japan)
  2. Quantum Beam Science Center, Japan Atomic Energy Agency, Sayo, Hyogo 679-5148 (Japan)
Publication Date:
OSTI Identifier:
22494401
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1696; Journal Issue: 1; Conference: XRM 2014: 12. international conference on X-ray microscopy, Melbourne (Australia), 26-31 Oct 2014; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; COMPARATIVE EVALUATIONS; DIFFRACTION; EFFICIENCY; FOCUSING; GRATINGS; HARD X RADIATION; KEV RANGE 01-10; PLATES; REFLECTION; SYNCHROTRON RADIATION