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Title: Multimodal hard x-ray nanoprobe facility by nested Montel mirrors aimed for 40nm resolution at Taiwan Photon Source

The hard X-ray nanoprobe facility at Taiwan Photon Source (TPS) provides multimodal X-ray detections, including XRF, XAS, XEOL, projection microscope, CDI, etc. Resulting from the large numerical aperture obtained by utilizing nested Montel mirrors, the beamline with a moderate length 75 meters can conduct similar performance with those beamlines longer than 100 meters. The mirrors are symmetrically placed with a 45 degrees cut. The beamline optics is thus designed to take the advantage of the symmetry of mirrors such that a round focal spot is accomplished. The size and the divergence of the focus spot are simulated around 40 nm and 6.29 mrad, respectively. The whole facility including the beamline and the stations will be operated under vacuum to preserve the photon coherence as well as to prevent the system from unnecessary environmental interference. A SEM in close cooperation with laser interferometers is equipped to precisely locate the position of the sample. This endstation is scheduled to be commissioned in the fall of 2016.
Authors:
; ; ; ; ; ; ;  [1] ;  [2]
  1. National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan (China)
  2. National Tsing-Hua University, Hsinchu 30076, Taiwan (China)
Publication Date:
OSTI Identifier:
22494392
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1696; Journal Issue: 1; Conference: XRM 2014: 12. international conference on X-ray microscopy, Melbourne (Australia), 26-31 Oct 2014; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ABSORPTION SPECTROSCOPY; HARD X RADIATION; INTERFERENCE; INTERFEROMETERS; LASERS; LENGTH; MIRRORS; OPTICS; PERFORMANCE; PHOTONS; RESOLUTION; SCANNING ELECTRON MICROSCOPY; SIMULATION; X-RAY DETECTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY