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Title: Differential phase contrast in scanning x-ray microscopy with half-wavelength phase shifter

A method for differential-phase-contrast imaging in scanning x-ray microscopy is proposed. The microfocus beam is produced with an x-ray focusing optics, and a half of the optical aperture is masked with a λ/2 phase shifter. This generates a pair of focused beam at the focal plane, with π phase difference. Combining with a diaphragm in front of the transmission beam detector, differential phase contrast (contrast proportional to the phase-difference between two foci) can be obtained. Preliminary results with a Fresnel zone plate focusing optics at 12.4 keV x-ray energy are shown.
Authors:
;  [1]
  1. Japan Synchrotron Radiation Research Institute (JASRI/SPring-8), Sayo, Hyogo 679-5198 (Japan)
Publication Date:
OSTI Identifier:
22494384
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1696; Journal Issue: 1; Conference: XRM 2014: 12. international conference on X-ray microscopy, Melbourne (Australia), 26-31 Oct 2014; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BEAMS; DIAPHRAGM; FOCUSING; FRESNEL COEFFICIENT; IMAGES; KEV RANGE 10-100; MICROSCOPY; OPTICS; PHASE SHIFT; WAVELENGTHS; X RADIATION