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Title: A More Accurate Measurement of the {sup 28}Si Lattice Parameter

In 2011, a discrepancy between the values of the Planck constant measured by counting Si atoms and by comparing mechanical and electrical powers prompted a review, among others, of the measurement of the spacing of {sup 28}Si (220) lattice planes, either to confirm the measured value and its uncertainty or to identify errors. This exercise confirmed the result of the previous measurement and yields the additional value d{sub 220} = 192 014 711.98(34) am having a reduced uncertainty.
Authors:
; ;  [1] ;  [2]
  1. INRIM—Istituto Nazionale di Ricerca Metrologica, Str. delle Cacce 91, 10135 Torino (Italy)
  2. Dipartimento di Fisica, UNITO—Università di Torino, v. P. Giuria 1, 10125 Torino (Italy)
Publication Date:
OSTI Identifier:
22493963
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Physical and Chemical Reference Data; Journal Volume: 44; Journal Issue: 3; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ATOMS; COMPARATIVE EVALUATIONS; CRYSTAL STRUCTURE; LATTICE PARAMETERS; SILICON; SILICON 28