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Title: Prediction of transmittance spectra for transparent composite electrodes with ultra-thin metal layers

Recent interest in indium-free transparent composite-electrodes (TCEs) has motivated theoretical and experimental efforts to better understand and enhance their electrical and optical properties. Various tools have been developed to calculate the optical transmittance of multilayer thin-film structures based on the transfer-matrix method. However, the factors that affect the accuracy of these calculations have not been investigated very much. In this study, two sets of TCEs, TiO{sub 2}/Au/TiO{sub 2} and TiO{sub 2}/Ag/TiO{sub 2}, were fabricated to study the factors that affect the accuracy of transmittance predictions. We found that the predicted transmittance can deviate significantly from measured transmittance for TCEs that have ultra-thin plasmonic metal layers. The ultrathin metal layer in the TCE is typically discontinuous. When light interacts with the metallic islands in this discontinuous layer, localized surface plasmons are generated. This causes extra light absorption, which then leads to the actual transmittance being lower than the predicted transmittance.
Authors:
;  [1] ;  [2] ;  [3] ;  [4]
  1. School for Engineering of Matter, Transport, and Energy, Arizona State University, Tempe, Arizona 85287 (United States)
  2. ON Semiconductor Corp., Phoenix, Arizona 85005 (United States)
  3. CHD-Fab, Freescale Semiconductor Inc., Tempe, Arizona 85224 (United States)
  4. Intel Corp., 2501 NW 229th Ave, Hillsboro, Oregon 97124 (United States)
Publication Date:
OSTI Identifier:
22492981
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 20; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ACCURACY; ELECTRODES; INDIUM; OPTICAL PROPERTIES; PLASMONS; SILVER; SPECTRA; THIN FILMS; TITANIUM OXIDES; TRANSFER MATRIX METHOD; VISIBLE RADIATION