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Title: Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits

Knowledge on surface potential dynamics is crucial for understanding the performance of modern-type nanoscale devices. We describe an electrical pump-probe approach in Kelvin-probe force microscopy that enables a quantitative measurement of dynamic surface potentials at nanosecond-time and nanometer-length scales. Also, we investigate the performance of pump-probe Kelvin-probe force microscopy with respect to the relevant experimental parameters. We exemplify a measurement on an organic field effect transistor that verifies the undisturbed functionality of our pump-probe approach in terms of simultaneous and quantitative mapping of topographic and electronic information at a high lateral and temporal resolution.
Authors:
; ; ; ; ;  [1]
  1. Institute of Applied Physics, Technische Universit├Ąt Dresden, D-01062 Dresden (Germany)
Publication Date:
OSTI Identifier:
22492820
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 15; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; FIELD EFFECT TRANSISTORS; LENGTH; MICROSCOPY; NANOSTRUCTURES; PROBES; RESOLUTION; SURFACE POTENTIAL