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Title: Electron beam induced growth of tin whiskers

We have investigated the influence of electron irradiation on tin whisker growth. Sputtered tin samples exposed to electron beam of 6 MeV energy exhibited fast whisker growth, while control samples did not grow any whiskers. The statistics of e-beam induced whiskers was found to follow the log-normal distribution. The observed accelerated whisker growth is attributed to electrostatic effects due to charges trapped in an insulating substrate. These results offer promise for establishing whisker-related accelerated life testing protocols.
Authors:
;  [1] ; ; ;  [2]
  1. Department of Physics and Astronomy, University of Toledo, Toledo, Ohio 43606 (United States)
  2. Department of Radiation Oncology, University of Toledo Health Science Campus, Toledo, Ohio 43614 (United States)
Publication Date:
OSTI Identifier:
22492745
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 12; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DISTRIBUTION; ELECTRON BEAMS; IRRADIATION; MEV RANGE 01-10; SPUTTERING; STATISTICS; SUBSTRATES; TIN; TRAPPING; WHISKERS