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Title: Parametrized dielectric functions of amorphous GeSn alloys

We obtained the complex dielectric function of amorphous Ge{sub 1−x}Sn{sub x} (0 ≤ x ≤ 0.07) alloys using spectroscopic ellipsometry from 0.4 to 4.5 eV. Amorphous GeSn films were formed by room-temperature implantation of phosphorus into crystalline GeSn alloys grown by molecular beam epitaxy. The optical response of amorphous GeSn alloys is similar to amorphous Ge and can be parametrized using a Kramers-Kronig consistent Cody-Lorentz dispersion model. The parametric model was extended to account for the dielectric functions of amorphous Ge{sub 0.75}Sn{sub 0.25} and Ge{sub 0.50}Sn{sub 0.50} alloys from literature. The compositional dependence of band gap energy E{sub g} and parameters associated with the Lorentzian oscillator have been determined. The behavior of these parameters with varying x can be understood in terms of the alloying effect of Sn on Ge.
Authors:
; ;  [1] ;  [2]
  1. Department of Electrical and Computer Engineering, National University of Singapore, Singapore 117583 (Singapore)
  2. Singapore Synchrotron Light Source, National University of Singapore, Singapore 117603 (Singapore)
Publication Date:
OSTI Identifier:
22492706
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 12; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ALLOYS; DIELECTRIC MATERIALS; ELLIPSOMETRY; FILMS; KRAMERS-KRONIG CORRELATION; MOLECULAR BEAM EPITAXY; OSCILLATORS; PHOSPHORUS; TEMPERATURE RANGE 0273-0400 K