Design of smart 3D-digital X-ray microtomographic scanners for non-destructive testing of materials and components of electronic devices with a multilayered structure
Abstract
The article studies the operating procedures of an X-ray microtomographic scanner and the module of reconstruction and analysis 3D-image of a test sample in particular. An algorithm for 3D-image reconstruction based on image shadow projections and mathematical methods of the processing are described. Chapter 1 describes the basic principles of X-ray tomography and general procedures of the device developed. Chapters 2 and 3 are devoted to the problem of resources saving by the system during the X-ray tomography procedure, which is achieved by preprocessing of the initial shadow projections. Preprocessing includes background noise removing from the images, which reduces the amount of shadow projections in general and increases the efficiency of the group shadow projections compression. Chapter 4 covers general procedures of defect search, which is based on vector analysis principles. In conclusion, the main applications of X-ray tomography are presented.
- Authors:
- National Research Tomsk State University, Tomsk, 634050 (Russian Federation)
- (Russian Federation)
- Publication Date:
- OSTI Identifier:
- 22492594
- Resource Type:
- Journal Article
- Journal Name:
- AIP Conference Proceedings
- Additional Journal Information:
- Journal Volume: 1683; Journal Issue: 1; Conference: International conference on advanced materials with hierarchical structure for new technologies and reliable structures 2015, Tomsk (Russian Federation), 21-25 Sep 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ALGORITHMS; BACKGROUND NOISE; COMPRESSION; DEFECTS; DESIGN; ELECTRONIC EQUIPMENT; IMAGE PROCESSING; IMAGES; LAYERS; NONDESTRUCTIVE TESTING; THREE-DIMENSIONAL CALCULATIONS; TOMOGRAPHY; VECTORS; X RADIATION
Citation Formats
Syryamkin, V. I., E-mail: hailun@mail.ru, Klestov, S. A., E-mail: klestov-simon@mail.ru, Echina, E. S., E-mail: zrtom1@mail.ru, Suntsov, S. B., E-mail: sbsun@iss-reshetnev.ru, and Academician M.F. Reshetnev Information Satellite Systems, Zheleznogorsk, Krasnoyarsk region, 662972. Design of smart 3D-digital X-ray microtomographic scanners for non-destructive testing of materials and components of electronic devices with a multilayered structure. United States: N. p., 2015.
Web. doi:10.1063/1.4932917.
Syryamkin, V. I., E-mail: hailun@mail.ru, Klestov, S. A., E-mail: klestov-simon@mail.ru, Echina, E. S., E-mail: zrtom1@mail.ru, Suntsov, S. B., E-mail: sbsun@iss-reshetnev.ru, & Academician M.F. Reshetnev Information Satellite Systems, Zheleznogorsk, Krasnoyarsk region, 662972. Design of smart 3D-digital X-ray microtomographic scanners for non-destructive testing of materials and components of electronic devices with a multilayered structure. United States. https://doi.org/10.1063/1.4932917
Syryamkin, V. I., E-mail: hailun@mail.ru, Klestov, S. A., E-mail: klestov-simon@mail.ru, Echina, E. S., E-mail: zrtom1@mail.ru, Suntsov, S. B., E-mail: sbsun@iss-reshetnev.ru, and Academician M.F. Reshetnev Information Satellite Systems, Zheleznogorsk, Krasnoyarsk region, 662972. 2015.
"Design of smart 3D-digital X-ray microtomographic scanners for non-destructive testing of materials and components of electronic devices with a multilayered structure". United States. https://doi.org/10.1063/1.4932917.
@article{osti_22492594,
title = {Design of smart 3D-digital X-ray microtomographic scanners for non-destructive testing of materials and components of electronic devices with a multilayered structure},
author = {Syryamkin, V. I., E-mail: hailun@mail.ru and Klestov, S. A., E-mail: klestov-simon@mail.ru and Echina, E. S., E-mail: zrtom1@mail.ru and Suntsov, S. B., E-mail: sbsun@iss-reshetnev.ru and Academician M.F. Reshetnev Information Satellite Systems, Zheleznogorsk, Krasnoyarsk region, 662972},
abstractNote = {The article studies the operating procedures of an X-ray microtomographic scanner and the module of reconstruction and analysis 3D-image of a test sample in particular. An algorithm for 3D-image reconstruction based on image shadow projections and mathematical methods of the processing are described. Chapter 1 describes the basic principles of X-ray tomography and general procedures of the device developed. Chapters 2 and 3 are devoted to the problem of resources saving by the system during the X-ray tomography procedure, which is achieved by preprocessing of the initial shadow projections. Preprocessing includes background noise removing from the images, which reduces the amount of shadow projections in general and increases the efficiency of the group shadow projections compression. Chapter 4 covers general procedures of defect search, which is based on vector analysis principles. In conclusion, the main applications of X-ray tomography are presented.},
doi = {10.1063/1.4932917},
url = {https://www.osti.gov/biblio/22492594},
journal = {AIP Conference Proceedings},
issn = {0094-243X},
number = 1,
volume = 1683,
place = {United States},
year = {Tue Oct 27 00:00:00 EDT 2015},
month = {Tue Oct 27 00:00:00 EDT 2015}
}