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Title: Crystallographic analysis of the implanted TiNi monocrystal containing misoriented localized shear mesobands in its near-surface layer [001]{sub B2}

The study was carried on for the implanted single TiNi crystal containing misoriented localized shear mesobands in its near-surface layer [001] B2. Due to the response of material to the Si ion implantation treatment of the single TiNi crystal, deformation mesobands would form in its near-surface layer. Specially designed software tools were employed for the treatment of experimental data obtained from X-ray and electron diffraction patterns. The 3D crystallographic orientations were calculated for the localized shear regions, which were displaced relative to one another and with respect to the original monocrystal orientation.
Authors:
;  [1] ;  [2] ; ; ;  [1]
  1. Institute of Strength Physics and Materials Science SB RAS, Tomsk, 634055 (Russian Federation)
  2. (Russian Federation)
Publication Date:
OSTI Identifier:
22492570
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1683; Journal Issue: 1; Conference: International conference on advanced materials with hierarchical structure for new technologies and reliable structures 2015, Tomsk (Russian Federation), 21-25 Sep 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 36 MATERIALS SCIENCE; COMPUTER CODES; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ION IMPLANTATION; LAYERS; MONOCRYSTALS; NICKEL ALLOYS; SHEAR; SILICON IONS; SURFACES; THREE-DIMENSIONAL CALCULATIONS; TITANIUM ALLOYS; X RADIATION