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Title: TEM investigation of the surface layer structure [111]{sub B2} of the single NiTi crystal modified by the Si-ion beam implantation

The study was carried on for the single NiTi crystals subjected to the Si-ion beam implantation. Using the transmission electron microscopy technique (TEM), the surface layer structure [111]{sub B2} was examined for the treated material. The modified near-surface sublayers were found to have different composition. Thus the uppermost sublayer contained mostly oxides; the lower-lying modified sublayer material was in an amorphous state and the thin underlying sublayer had a defect structure.
Authors:
;  [1] ; ;  [1] ;  [2]
  1. Institute of Strength Physics and Materials Science SB RAS, Tomsk, 634055 (Russian Federation)
  2. (Russian Federation)
Publication Date:
OSTI Identifier:
22492525
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1683; Journal Issue: 1; Conference: International conference on advanced materials with hierarchical structure for new technologies and reliable structures 2015, Tomsk (Russian Federation), 21-25 Sep 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 36 MATERIALS SCIENCE; AMORPHOUS STATE; CRYSTALS; DEFECTS; ION BEAMS; LAYERS; NICKEL COMPOUNDS; OXIDES; SILICON IONS; SURFACES; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY