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Title: External noise-induced transitions in a current-biased Josephson junction

We investigate noise-induced transitions in a current-biased and weakly damped Josephson junction in the presence of multiplicative noise. By using the stochastic averaging procedure, the averaged amplitude equation describing dynamic evolution near a constant phase difference is derived. Numerical results show that a stochastic Hopf bifurcation between an absorbing and an oscillatory state occurs. This means the external controllable noise triggers a transition into the non-zero junction voltage state. With the increase of noise intensity, the stationary probability distribution peak shifts and is characterised by increased width and reduced height. And the different transition rates are shown for large and small bias currents.
Authors:
;  [1] ;  [2]
  1. School of Mathematics and Physics, Yancheng Institute of Technology, Yancheng 224051 (China)
  2. College of Mechanical and Vehicle Engineering, Hunan University, Changsha 410082 (China)
Publication Date:
OSTI Identifier:
22492413
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 6; Journal Issue: 1; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; AMPLITUDES; BIFURCATION; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; EVOLUTION; JOSEPHSON JUNCTIONS; PROBABILITY; SEMICONDUCTOR JUNCTIONS; STOCHASTIC PROCESSES