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Title: Electron-beam-induced current measurements with applied bias provide insight to locally resolved acceptor concentrations at p-n junctions

Electron-beam-induced current (EBIC) measurements have been employed for the investigation of the local electrical properties existing at various types of electrical junctions during the past decades. In the standard configuration, the device under investigation is analyzed under short-circuit conditions. Further insight into the function of the electrical junction can be obtained when applying a bias voltage. The present work gives insight into how EBIC measurements at applied bias can be conducted at the submicrometer level, at the example of CuInSe{sub 2} solar cells. From the EBIC profiles acquired across ZnO/CdS/CuInSe{sub 2}/Mo stacks exhibiting p-n junctions with different net doping densities in the CuInSe{sub 2} layers, values for the width of the space-charge region, w, were extracted. For all net doping densities, these values decreased with increasing applied voltage. Assuming a linear relationship between w{sup 2} and the applied voltage, the resulting net doping densities agreed well with the ones obtained by means of capacitance-voltage measurements.
Authors:
; ; ;  [1] ;  [2]
  1. Helmholtz-Zentrum Berlin für Materialien und Energie, Hahn-Meitner-Platz 1, 14109 Berlin (Germany)
  2. Technische Universität Berlin, Department of Semiconductor Devices, Einsteinufer 19, 10587 Berlin (Germany)
Publication Date:
OSTI Identifier:
22492285
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 7; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CADMIUM SULFIDES; CAPACITANCE; CONCENTRATION RATIO; COPPER COMPOUNDS; DENSITY; ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRICAL FAULTS; INDIUM SELENIDES; LAYERS; MOLYBDENUM; P-N JUNCTIONS; SCANNING ELECTRON MICROSCOPY; SOLAR CELLS; SPACE CHARGE; ZINC OXIDES