skip to main content

SciTech ConnectSciTech Connect

Title: Atomic-scale microstructure underneath nanoindentation in Al-Cr-N ceramic films

In this work, Al-Cr-N ceramic films deformed by nanoindentation were peeled off from silicon substrates and their atomic-scale microstructures underneath the indenter were investigated by high resolution transmission electron microscope (HR-TEM). Dislocations were formed underneath the indenter and they accumulated along nano-grain boundaries. The accumulative dislocations triggered the crack initiation along grain boundaries, and further resulted in the crack propagation. Dislocations were also observed in nano-grains on the lateral contact area. A model was proposed to describe the variation of microstructures under nanoindentation.
Authors:
;  [1] ;  [2]
  1. Beijing Key Lab of Microstructure and Properties of Advanced Materials, Beijing University of Technology, Beijing 100124 (China)
  2. School of Materials Science and Engineering, South China University of Technology, Guangzhou 510640 (China)
Publication Date:
OSTI Identifier:
22492251
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 12; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM COMPOUNDS; CERAMICS; CHROMIUM NITRIDES; CRACK PROPAGATION; DISLOCATIONS; FILMS; GRAIN BOUNDARIES; RESOLUTION; SILICON; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; VARIATIONS