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Title: Suppression of surface charge accumulation on Al{sub 2}O{sub 3}-filled epoxy resin insulator under dc voltage by direct fluorination

Surface charge accumulation on insulators under high dc voltage is a major factor that may lead to the reduction of insulation levels in gas insulated devices. In this paper, disc insulators made of Al{sub 2}O{sub 3}-filled epoxy resin were surface fluorinated using a F{sub 2}/N{sub 2} mixture (12.5% F{sub 2}) at 50 °C and 0.1 MPa for different durations of 15 min, 30 min and 60 min. A dc voltage was applied to the insulator for 30 min and the charge density on its surface was measured by an electrostatic probe. The results revealed significant lower surface charge densities on the fluorinated insulators in comparison with the original one. Surface conductivity measurements indicated a higher surface conductivity by over three orders of magnitude after fluorination, which would allow the charges to transfer along the surface and thus may suppress their accumulation. Further, attenuated total reflection infrared analysis and surface morphology observations of the samples revealed that the introduction of fluoride groups altered the surface physicochemical properties. These structure changes, especially the physical defects reduced the depth of charge traps in the surface layer, which was verified by the measurement of energy distributions of the electron and hole traps based on themore » isothermal current theory. The results in this paper demonstrate that fluorination can be a promising and effective method to suppress surface charge accumulation on epoxy insulators in gas insulated devices.« less
Authors:
; ; ;  [1] ;  [1] ;  [2] ;  [3]
  1. Department of Electrical Engineering, Tsinghua University, Beijing 100084 (China)
  2. (China)
  3. Department of Electrical Engineering, Tongji University, Shanghai 201804 (China)
Publication Date:
OSTI Identifier:
22492236
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 12; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM OXIDES; CHARGE DENSITY; COMPARATIVE EVALUATIONS; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRONS; ELECTROSTATIC PROBES; ENERGY SPECTRA; EPOXIDES; FLUORIDES; FLUORINATION; HOLES; LAYERS; MORPHOLOGY; REDUCTION; REFLECTION; RESINS; SURFACES; TRAPS