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Title: X-ray absorption spectroscopy of Mn doped ZnO thin films prepared by rf sputtering technique

A set of r.f. sputter deposited ZnO thin films prepared with different Mn doping concentrations have been characterised by Extended X-ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Spectroscopy (XANES) measurements at Zn, Mn and O K edges and at Mn L{sub 2,3} edges apart from long range structural characterisation by Grazing Incident X-ray Diffraction (GIXRD) technique. Magnetic measurements show room temperature ferromagnetism in samples with lower Mn doping which is however, gets destroyed at higher Mn doping concentration. The results of the magnetic measurements have been explained using the local structure information obtained from EXAFS and XANES measurements.
Authors:
; ;  [1] ;  [2] ; ;  [3]
  1. Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, Mumbai – 400 085 (India)
  2. Atomic & Molecular Physics Division, Bhabha Atomic Research Centre, VIZAG Centre, Visakhapatnam-530012 (India)
  3. UGC DAE Consortium for Scientific Research, Indore-452001 (India)
Publication Date:
OSTI Identifier:
22492186
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 11; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTROSCOPY; CONCENTRATION RATIO; DOPED MATERIALS; FERROMAGNETIC MATERIALS; FERROMAGNETISM; FINE STRUCTURE; SPUTTERING; THIN FILMS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY; ZINC OXIDES