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Title: Comparison between laser terahertz emission microscope and conventional methods for analysis of polycrystalline silicon solar cell

A laser terahertz emission microscope (LTEM) can be used for noncontact inspection to detect the waveforms of photoinduced terahertz emissions from material devices. In this study, we experimentally compared the performance of LTEM with conventional analysis methods, e.g., electroluminescence (EL), photoluminescence (PL), and laser beam induced current (LBIC), as an inspection method for solar cells. The results showed that LTEM was more sensitive to the characteristics of the depletion layer of the polycrystalline solar cell compared with EL, PL, and LBIC and that it could be used as a complementary tool to the conventional analysis methods for a solar cell.
Authors:
;  [1] ; ; ; ;  [2]
  1. SCREEN Holdings Co., Ltd., Kyoto, 612-8486 (Japan)
  2. Institute of Laser Engineering, Osaka University, Suita, 565-0871 (Japan)
Publication Date:
OSTI Identifier:
22492184
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Advances; Journal Volume: 5; Journal Issue: 11; Other Information: (c) 2015 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; COMPARATIVE EVALUATIONS; DEPLETION LAYER; ELECTROLUMINESCENCE; LASER RADIATION; PERFORMANCE; PHOTOLUMINESCENCE; POLYCRYSTALS; SILICON SOLAR CELLS; THZ RANGE; WAVE FORMS