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Title: Electro-physical characterization of individual and arrays of ZnO nanowires

Capacitance measurements were made on an array of parallel ZnO nanowires embedded in a polymer matrix and provided with two electrodes perpendicular to the nanowires. The capacitance monotonically increased, and saturated at large negative (depleting) and large positive (accumulating) voltages. A qualitative explanation for this behavior is presented, taking into account specific features of quasi-one-dimensional screening. The increasing or decreasing character of the capacitance-voltage characteristics were determined by the conductivity type of the nanowires, which in our case was n-type. A dispersion of the experimental capacitance was observed over the entire frequency range of 1 kHz to 5 MHz. This phenomenon is explained by the slow discharge of the nanowires through the thin dielectric layer that separates them from the top electrode. Separate measurements on individual identical nanowires in a field effect transistor configuration yielded an electron concentration and mobility of approximately 10{sup 17 }cm{sup −3} and 150 cm{sup 2}/Vs, respectively, at room temperature.
Authors:
 [1] ; ;  [2] ; ;  [3]
  1. Department of Electrical Engineering, University of North Texas, 1155 Union Circle, Denton, Texas 76203 (United States)
  2. Department of Physics, University of North Texas, 1155 Union Circle, Denton, Texas 76203 (United States)
  3. Centre for Advanced Nanotechnology, University of Toronto, Toronto M5S 3E3 (Canada)
Publication Date:
OSTI Identifier:
22490795
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 3; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CAPACITANCE; ELECTRIC POTENTIAL; FIELD EFFECT TRANSISTORS; KHZ RANGE 01-100; LAYERS; MHZ RANGE 01-100; NANOWIRES; TEMPERATURE RANGE 0273-0400 K; ZINC OXIDES