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Title: Probing on green long persistent Eu{sup 2+}/Dy{sup 3+} doped Sr{sub 3}SiAl{sub 4}O{sub 11} emerging phosphor for security applications

Journal Article · · Journal of Applied Physics
DOI:https://doi.org/10.1063/1.4922983· OSTI ID:22490719
 [1]; ;  [1];  [2];  [3]
  1. CSIR—National Physical Laboratory, Dr K S Krishnan Road, New Delhi 110012 (India)
  2. Amity Institute of Applied Science, Amity University, Noida, Uttar Pradesh 201303 (India)
  3. Department of Physics, Kalindi College, University of Delhi, New Delhi, 110008 (India)

Herein, a novel green emitting long-persistent Sr{sub 3}SiAl{sub 4}O{sub 11}:Eu{sup 2+}/Dy{sup 3+} phosphor was synthesized in a single phase form using facile solid state reaction method under the reducing atmosphere of 10% H{sub 2} and 90% N{sub 2}. The resulting phosphor exhibits hyper-sensitive strong broad green emission, peaking at 510 nm upon 340 nm excitation wavelength, which is attributed to the 4f{sup 6}5d{sup 1}-4f{sup 7} transitions of emission center of europium (Eu{sup 2+}) ions. Moreover, the incorporation of dysprosium (Dy{sup 3+}) ions, which act as effective hole trap centers with appropriate depth, largely enhances the photoluminescence characteristics and greatly improves the persistent intense luminescence behavior of Sr{sub 3}SiAl{sub 4}O{sub 11}:Eu{sup 2+}/Dy{sup 3+} phosphor under ultraviolet (UV) excitation. In addition, with the optimum doping concentration and sufficient UV excitation time period, the as-synthesized phosphor can be persisted afterglow for time duration ∼4 h with maximum luminescence intensity. Thus, these results suggest that this phosphor could be expected as an ultimate choice for next generation advanced luminescent materials in security applications such as latent finger-marks detection, photo-masking induced phosphorescent images, and security code detection.

OSTI ID:
22490719
Journal Information:
Journal of Applied Physics, Vol. 117, Issue 24; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
Country of Publication:
United States
Language:
English