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Title: Micro-wrinkling and delamination-induced buckling of stretchable electronic structures

This paper presents the results of experimental and theoretical/computational micro-wrinkles and buckling on the surfaces of stretchable poly-dimethylsiloxane (PDMS) coated with nano-scale Gold (Au) layers. The wrinkles and buckles are formed by the unloading of pre-stretched PDMS/Au structure after the evaporation of nano-scale Au layers. They are then characterized using atomic force microscopy and scanning electron microscopy. The critical stresses required for wrinkling and buckling are analyzed using analytical models. The possible interfacial cracking that can occur along with film buckling is also studied using finite element simulations of the interfacial crack growth. The implications of the results are discussed for potential applications of micro-wrinkles and micro-buckles in stretchable electronic structures and biomedical devices.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [3] ;  [4] ;  [4] ; ;  [1] ;  [5] ;  [2] ;  [5] ;  [6] ;  [2] ;
  1. Department of Theoretical and Applied Physics, African University of Science and Technology, Km 10, Airport Road, Galadimawa, Abuja, Federal Capital Territory (Nigeria)
  2. (Nigeria)
  3. Department of Mechanical and Aerospace Engineering, Princeton University, Olden Street, Princeton, New Jersey 08544 (United States)
  4. (United States)
  5. Department of Materials Science and Engineering, African University of Science and Technology, Km 10, Airport Road, Galadimawa, Abuja, Federal Capital Territory (Nigeria)
  6. Department of Materials Science and Engineering, Kwara State University, Malete, P.M.B 1530, Ilorin, Kwara State (Nigeria)
Publication Date:
OSTI Identifier:
22490716
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 23; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMIC FORCE MICROSCOPY; BUCKLING; CRACK PROPAGATION; ELECTRONIC STRUCTURE; EVAPORATION; FINITE ELEMENT METHOD; GOLD; LAYERS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY