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Title: Effects of polarization of polar semiconductor on electrical properties of poly(vinylidene fluoride-trifluoroethylene)/ZnO heterostructures

The electrical properties of heterostructures composed of poly(vinylidene fluoride-trifluoroethylene) (P(VDF-TrFE)) and ZnO with different crystallographic polarities, i.e., O- and Zn-polar ZnO, were investigated. Distinct differences in the capacitance-voltage and polarization-voltage characteristics between the P(VDF-TrFE)/O- and Zn-polar ZnO were obtained in the depletion regions of ZnO. The band configurations were determined by X-ray photoelectron spectroscopy (XPS) using a synchrotron radiation beam to analyze the differences in the electrical properties of the P(VDF-TrFE)/O- and Zn-polar ZnO. The XPS spectra indicated that the valence band maximum of P(VDF-TrFE) is 2.9 and 2.7‚ÄČeV higher than Zn- and O-polar ZnO, respectively. Thus, both structures have staggered band configurations with large valence band offsets, and the spontaneous polarization of ZnO is less effective on the band lineup. The electrical properties of the P(VDF-TrFE)/ZnO heterostructures are modulated through carrier generation because of the polarization-mediated interface charges and the staggered band alignments of the P(VDF-TrFE)/ZnO with a large valence band offset.
Authors:
; ;  [1]
  1. Department of Physics and Electronics, Osaka Prefecture University, Sakai, Osaka 599-8531 (Japan)
Publication Date:
OSTI Identifier:
22490712
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 117; Journal Issue: 23; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CAPACITANCE; CARRIERS; CRYSTALLOGRAPHY; ELECTRIC POTENTIAL; EV RANGE 01-10; FLUORINATED ALIPHATIC HYDROCARBONS; INTERFACES; POLARIZATION; POLYVINYLS; SEMICONDUCTOR MATERIALS; SPECTRA; SYNCHROTRON RADIATION; VALENCE; X-RAY PHOTOELECTRON SPECTROSCOPY; ZINC OXIDES