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Title: Room temperature ferromagnetism in undoped and Ni doped In{sub 2}O{sub 3} thin films

Undoped and Ni (5 at.%) doped In{sub 2}O{sub 3} thin films were deposited on glass substrate using electron beam evaporation technique and Ni doped In{sub 2}O{sub 3} thin films were annealed at 450 oC. A systematic study was carried out on the structural, chemical and magnetic properties of the as deposited and annealed thin films. X-ray diffraction analysis revealed that all the films were cubic in structure and exhibied ferromagnetism at room temperature. The undoped In{sub 2}O{sub 3} thin films exhibited a saturation magnetization of 24.01 emu/cm3. Ni doped In{sub 2}O{sub 3} thin films annealed at 450 oC showed a saturation magnetization of 53.81 emu/cm3.
Authors:
; ; ; ;  [1] ;  [2] ;  [3]
  1. Thin Films Laboratory, School of Advanced Sciences, VIT University, Vellore – 632014 (India)
  2. Materials Science Group, Indira Gandhi Centre for Atomic Research, Kalpakkam – 603102 (India)
  3. (India)
Publication Date:
OSTI Identifier:
22490561
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; CUBIC LATTICES; DOPED MATERIALS; ELECTRON BEAMS; EVAPORATION; FERROMAGNETISM; GLASS; INDIUM OXIDES; MAGNETIC PROPERTIES; MAGNETIZATION; NICKEL; SATURATION; SUBSTRATES; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; THIN FILMS; X-RAY DIFFRACTION