skip to main content

Title: Structural and optical properties of oxygen irradiated Zn{sub 1-x}Mg{sub x}O (x = 0, 0.2) thin films

In the present study we report the effect of oxygen ion beam irradiation on the structural and optical properties of pure and 20% Mg doped ZnO thin films. These films were grown on Si substrate using RF sputtering technique. X-ray diffraction study confirms the formation of hexagonal wurtzite phase and the lattice parameter is found to reduce by Mg incorporation which further decreases after irradiation. The optical properties of the thin films using UV-Vis spectroscopy technique indicate an increment in the optical band gap with Mg incorporation as well as after irradiation.
Authors:
;  [1] ;  [2]
  1. Department of Physics, Indian Institute of Technology Delhi, New Delhi – 110 016 (India)
  2. Materials Science Division, Inter University Accelerator Centre, New Delhi – 110 067 (India)
Publication Date:
OSTI Identifier:
22490548
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION SPECTROSCOPY; DOPED MATERIALS; ENERGY GAP; HEXAGONAL LATTICES; IRRADIATION; LATTICE PARAMETERS; MAGNESIUM; OPTICAL PROPERTIES; OXYGEN; OXYGEN IONS; SILICON; SPUTTERING; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES