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Title: Structural characterization of InSb thin films grown by electrodeposition

In the present work we have grown InSb thin films on brass substrates, using the electrodeposition technique. The electrochemical baths used in the growth were made up of aqueous solutions of InCl{sub 3} and SbCl{sub 3} mixed together in various proportions. The films grown were characterized by X-Ray diffraction (XRD), Scanning Electron Microscopy (SEM), and Energy Dispersive Analysis of X-rays (EDAX). Compositional studies show that stoichiometric InSb films can be prepared from a bath containing 0.05M InCl{sub 3} and 0.04M SbCl{sub 3}. XRD studies reveal that the films grown are polycrystalline having the zinc blende structure with (111) orientation. Crystallite size, dislocation density and strain were calculated using the XRD results. Optical transmission spectra were recorded using an FTIR spectrophotometer. The value of direct band gap was found to be around 0.20 eV for the thin films having the best stoichiometry.
Authors:
;  [1]
  1. School of Studies in Physics, Jiwaji University, Gwalior-474011 (India)
Publication Date:
OSTI Identifier:
22490428
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANTIMONY CHLORIDES; AQUEOUS SOLUTIONS; BRASS; DISLOCATIONS; ELECTROCHEMISTRY; ELECTRODEPOSITION; EV RANGE; FOURIER TRANSFORMATION; INDIUM ANTIMONIDES; INDIUM CHLORIDES; INFRARED SPECTRA; POLYCRYSTALS; SCANNING ELECTRON MICROSCOPY; SPECTROPHOTOMETRY; STRAINS; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION; ZINC SULFIDES