skip to main content

SciTech ConnectSciTech Connect

Title: Structural and optical properties of electron beam evaporated yttria stabilized zirconia thin films

Yttria stabilized zirconia (10 mole % Y{sub 2}O{sub 3}) thin films were deposited on quartz substrates using electron beam physical vapor deposition at the substrate temperatures in the range 300 – 973 K. XRD analysis showed cubic crystalline phase of YSZ films with preferred orientation along (111). The surface roughness was found to increase with the increase of deposition temperatures. The optical band gap of ∼5.7 eV was calculated from transmittance curves. The variation in the optical properties is correlated with the changes in the microstructural features of the films prepared as a function of substrate temperature.
Authors:
; ; ;  [1] ; ;  [2]
  1. Centre for Nanoscience and Nanotechnology, Sathyabama University, Chennai-600119 (India)
  2. Physical Metallurgy Group, Indira Gandhi Centre for Atomic Research, Kalpakkam 603102 (India)
Publication Date:
OSTI Identifier:
22490417
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CRYSTAL STRUCTURE; CUBIC LATTICES; ELECTRON BEAMS; EV RANGE; GRAIN ORIENTATION; OPTICAL PROPERTIES; PHYSICAL VAPOR DEPOSITION; QUARTZ; ROUGHNESS; SUBSTRATES; SURFACES; THIN FILMS; X-RAY DIFFRACTION; YTTRIUM OXIDES; ZIRCONIUM OXIDES