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Title: Comparative study of structural, optical and impedance measurements on V{sub 2}O{sub 5} and V-Ce mixed oxide thin films

Vanadium pentoxide (V{sub 2}O{sub 5}) and Vanadium-Cerium mixed oxide thin films at different molar ratios of V{sub 2}O{sub 5} and CeO{sub 2} have been deposited at 200 W rf power by rf planar magnetron sputtering in pure argon atmosphere. The structural and optical properties were studied by taking X-ray diffraction and transmittance and absorption spectra respectively. The amorphous thin films show an increase in transmittance and optical bandgap with increase in CeO{sub 2} content in as-prepared thin films. The impedance measurements for as-deposited thin films show an increase in electrical conductivity with increase in CeO{sub 2} material.
Authors:
 [1] ;  [2]
  1. Department of Physics, The American College, Madurai-625 012 (India)
  2. Department of Physic, Alagappa Chettiar College of Engg. & Tech., Karaikudi-630 004 (India)
Publication Date:
OSTI Identifier:
22490413
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABSORPTION SPECTRA; AMORPHOUS STATE; ARGON; CERIUM; CERIUM OXIDES; ELECTRIC CONDUCTIVITY; ENERGY GAP; IMPEDANCE; OPACITY; SPUTTERING; THIN FILMS; VANADIUM; VANADIUM OXIDES; X-RAY DIFFRACTION