skip to main content

SciTech ConnectSciTech Connect

Title: Growth of MoO{sub 3} nanostructured thin films as a function of O{sub 2}-partial pressure

In this report, we synthesized molybdenum trioxide (α-MoO{sub 3}) nanostructured thin films (NST{sub s}) with nanoflakes (NF{sub s}) on the Ni-coated glass substrates employing plasma assisted sublimation process (PASP) as a function of oxygen partial pressure (PO{sub 2}). The effect of oxygen partial pressure on structural, morphological, and vibrational properties have been investigated systematically. The structural analysis divulged that all films deposited at different PO{sub 2} have pure orthorhombic phase, no impurity phase is detected under the limit of resolution. The morphological studies of samples is carried out by SEM, revealed that features as well as alignment of MoO{sub 3} NST{sub s} can be monitored by PO{sub 2} and the sample having best features is obtained at 7.5×10{sup −2} Torr. In addition, the more insight information is accomplished by TEM/HRTEM on the best featured sample, which confirmed the single crystalline nature of nanoflakes. The vibrational study of all samples are performed by FTIR, and strongly supports the XRD observations. All the results are in consonance with each other.
Authors:
; ;  [1]
  1. Thin film Laboratory, Department of Physics, Indian Institute of Technology Delhi -110016 (India)
Publication Date:
OSTI Identifier:
22490388
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; FOURIER TRANSFORMATION; GLASS; INFRARED SPECTRA; MOLYBDENUM OXIDES; MONOCRYSTALS; NANOSTRUCTURES; ORTHORHOMBIC LATTICES; PARTIAL PRESSURE; PRESSURE DEPENDENCE; SCANNING ELECTRON MICROSCOPY; SUBLIMATION; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION