Effect of Te addition into As{sub 2}Se{sub 3} thin film: Optical property study by FTIR and XPS

Journal Article · Wed Jun 24 00:00:00 EDT 2015 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4917907· OSTI ID:22490385

Panda, Tribikram; Naik, R. ^[1]; Chinnaiyah, S.; Ganesan, R. ^[2]

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1. Department of Physics, Utkal University, Bhubaneswar-751004, Odisha (India)
2. Department of Physics, Indian Institute of Science, Bangalore-560012 (India)

In the present work, we report the effect of Te deposition onto As{sub 2}Se{sub 3} film which affects the optical properties. The Te/As{sub 2}Se{sub 3} film was illuminated with 532 nm laser to study the photo induced diffusion. The prepared As{sub 2}Se{sub 3}, Te/As{sub 2}Se{sub 3} films were characterized by X-ray diffraction which show a completely amorphous nature. On the basis of optical transmission data carried out by Fourier Transform infrared Spectroscopy, a non direct transition was found for these films. The optical bandgap is found to be decreased with Te deposition and photo darkening phenomena is observed for the diffused film. The change in the optical constants are also supported by the corresponding change in different types of bonds which are being analyzed by X-ray photoelectron spectroscopy.

• OSTI ID: 22490385
• Journal Information: AIP Conference Proceedings, Vol. 1665, Issue 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTROSCOPY
AMORPHOUS STATE
ARSENIC SELENIDES
DEPOSITION
DIFFUSION
ENERGY GAP
FOURIER TRANSFORMATION
INFRARED SPECTRA
LASER RADIATION
OPTICAL PROPERTIES
TELLURIUM
THIN FILMS
X-RAY DIFFRACTION
X-RAY PHOTOELECTRON SPECTROSCOPY