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Title: Magnetic properties of Ni nanoparticles embedded in silica matrix (KIT-6) synthesized via novel chemical route

Thermally stable Ni nanoparticles have been embedded in mesoporous silica matrix (KIT-6) via novel chemical reduction method by using superhydride as reducing agent. X-ray diffraction (XRD) study confirms that pure and embedded Ni nanoparticles crystallize in face centered cubic (fcc) structure. Crystallite sizes of pure Ni, 4 wt% and 8 wt% Ni in silica were estimated to be 6.0 nm, 10.4 nm and 10.5 nm, respectively. Morphology and dispersion of Ni in silica matrix were studied by scanning electron microscopy (SEM). Magnetic study shows enhancement of magnetic moments of Ni nanoparticles embedded in silica matrix compared with that of pure Ni. The result has been interpreted on the basis of size reduction and magnetic exchange effects. Saturation magnetization values for pure Ni, 4 wt% and 8 wt% Ni in silica were found to be 15.77 emu/g, 5.08 emu/g and 2.00 emu/g whereas coercivity values were 33.72 Oe, 92.47 Oe and 64.70 Oe, respectively. We anticipate that the observed magnetic properties may find application as soft magnetic materials.
Authors:
;  [1] ;  [2]
  1. Department of Chemistry, BITS-Pilani, K. K. Birla Goa Campus, Zuarinagar, Goa-403726 (India)
  2. Defence Metallurgical Research Laboratory, Hyderabad-500058 (India)
Publication Date:
OSTI Identifier:
22490263
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; COERCIVE FORCE; COMPARATIVE EVALUATIONS; FCC LATTICES; MAGNETIC MATERIALS; MAGNETIC MOMENTS; MAGNETIC PROPERTIES; MAGNETIZATION; MATRIX MATERIALS; MORPHOLOGY; NANOPARTICLES; NANOSTRUCTURES; NICKEL; REDUCING AGENTS; SCANNING ELECTRON MICROSCOPY; SILICA; X-RAY DIFFRACTION