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Title: Probing depth dependent structure and magnetic properties of thin films using polarized neutron reflectivity

Novel properties of materials produced using nanoscale manufacturing processes often arise from interactions across interfaces between dissimilar materials. In order to understand the physical and magnetic properties of such nanostructures, a thorough and detailed structural and magnetic characterization with interface specificity is required. X-ray reflectivity and polarized neutron reflectivity (PNR) are two nondestructive techniques that provide quantitative measures of the chemical and magnetic depth profiles of the films with less than nanometer resolution averaged over the lateral dimensions of the entire sample (typically 100 mm{sup 2}). PNR specifically gives simultaneous structure and magnetic information of the interfaces. Unquestionably, neutron reflectivity has played a decisive role in the development and study of new emergent phenomena at interfaces.
Authors:
 [1] ;
  1. Solid State Physics Division, Bhabha Atomic Research Centre, Mumbai-400085 India (India)
Publication Date:
OSTI Identifier:
22490177
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1665; Journal Issue: 1; Conference: 59. DAE solid state physics symposium 2014, Tamilnadu (India), 16-20 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DEPTH; INTERFACES; MAGNETIC PROPERTIES; NANOSTRUCTURES; NEUTRON BEAMS; NEUTRON DIFFRACTION; POLARIZED BEAMS; PROBES; REFLECTIVITY; RESOLUTION; SPECIFICITY; THIN FILMS