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Title: Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10{sup −12} Am{sup 2}, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.
Authors:
; ; ; ;  [1] ;  [2] ; ;  [3]
  1. Huygens-Kamerlingh Onnes Laboratory, Leiden University, Niels Bohrweg 2, 2333CA Leiden (Netherlands)
  2. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft (Netherlands)
  3. Van der Waals-Zeeman Institute, University of Amsterdam, Science Park 904, 1090 GL Amsterdam (Netherlands)
Publication Date:
OSTI Identifier:
22490173
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 7; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMS; DEPOSITION; ELECTRON BEAMS; FILMS; ION BEAMS; MAGNETIC MOMENTS; MAGNETIC RESONANCE; MICROSCOPY; TRAPPING