Probing the magnetic moment of FePt micromagnets prepared by focused ion beam milling

Journal Article · Mon Aug 17 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4928929· OSTI ID:22490173

Overweg, H. C.; Eerkens, H. J.; Bossoni, L.; Alkemade, P. F. A. ^[1]; La Rooij, A. L.; Spreeuw, R. J. C. ^[2]

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1. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft (Netherlands)
2. Van der Waals-Zeeman Institute, University of Amsterdam, Science Park 904, 1090 GL Amsterdam (Netherlands)

We investigate the degradation of the magnetic moment of a 300 nm thick FePt film induced by Focused Ion Beam (FIB) milling. A 1 μm × 8 μm rod is milled out of a film by a FIB process and is attached to a cantilever by electron beam induced deposition. Its magnetic moment is determined by frequency-shift cantilever magnetometry. We find that the magnetic moment of the rod is μ = 1.1 ± 0.1 × 10{sup −12} Am{sup 2}, which implies that 70% of the magnetic moment is preserved during the FIB milling process. This result has important implications for atom trapping and magnetic resonance force microscopy, which are addressed in this paper.

• OSTI ID: 22490173
• Journal Information: Applied Physics Letters, Vol. 107, Issue 7; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ATOMS
DEPOSITION
ELECTRON BEAMS
FILMS
ION BEAMS
MAGNETIC MOMENTS
MAGNETIC RESONANCE
MICROSCOPY
TRAPPING