skip to main content

SciTech ConnectSciTech Connect

Title: Low-kilovolt coherent electron diffractive imaging instrument based on a single-atom electron source

In this work, a transmission-type, low-kilovolt coherent electron diffractive imaging instrument was constructed. It comprised a single-atom field emitter, a triple-element electrostatic lens, a sample holder, and a retractable delay line detector to record the diffraction patterns at different positions behind the sample. It was designed to image materials thinner than 3 nm. The authors analyzed the asymmetric triple-element electrostatic lens for focusing the electron beams and achieved a focused beam spot of 87 nm on the sample plane at the electron energy of 2 kV. High-angle coherent diffraction patterns of a suspended graphene sample corresponding to (0.62 Å){sup −1} were recorded. This work demonstrated the potential of coherent diffractive imaging of thin two-dimensional materials, biological molecules, and nano-objects at a voltage between 1 and 10 kV. The ultimate goal of this instrument is to achieve atomic resolution of these materials with high contrast and little radiation damage.
Authors:
 [1] ; ; ; ; ;  [2] ;  [3]
  1. Department of Physics, National Taiwan University, Taipei 10617, Taiwan (China)
  2. Institute of Physics, Academia Sinica, Nankang, Taipei 11529, Taiwan (China)
  3. Department of Materials Science and Engineering, National Tsing Hua University, Hsinchu 30013, Taiwan (China)
Publication Date:
OSTI Identifier:
22489811
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films; Journal Volume: 34; Journal Issue: 2; Other Information: (c) 2015 American Vacuum Society; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ATOMS; DESIGN; DIFFRACTION; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTROSTATIC LENSES; FOCUSING; GRAPHENE; MATERIALS; RADIATION EFFECTS; RESOLUTION; SAMPLE HOLDERS; TWO-DIMENSIONAL SYSTEMS