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Title: Direct comparison of defect ensembles extracted from damage probability and raster scan measurements

The presented study addresses the characterization of nanometer sized defects acting as damage precursors in nanosecond laser pulse duration regime. Two approaches are used to extract distributions of localized damage precursors, namely, damage probability and damage density measurements. Testing is performed on uncoated and SiO{sub 2} monolayer film deposited fused silica substrate exposed with pulsed UV irradiation (355 nm, 4.8 ns). Then, a direct comparison of damage precursor ensembles obtained from both methods is carried out. Our analysis indicates apparent differences between both methods that are discussed in detail. Contamination by ablation products is identified as one of the key factors that influence damage density measurements.
Authors:
; ;  [1]
  1. Laser Research Center, Vilnius University, Saulėtekio al. 10 LT-10223 Vilnius (Lithuania)
Publication Date:
OSTI Identifier:
22489477
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 118; Journal Issue: 10; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABLATION; COMPARATIVE EVALUATIONS; DAMAGE; DEFECTS; DENSITY; DISTRIBUTION; FILMS; IRRADIATION; LASERS; PRECURSOR; PROBABILITY; PULSES; SILICA; SILICON OXIDES; SUBSTRATES