Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Journal Article · Mon Jan 25 00:00:00 EST 2016 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4940891· OSTI ID:22489343

Eren, B. ^[1]; Gysin, U.; Glatzel, Th.; Steiner, R.; Meyer, E. ^[1]

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1. Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland)

Few layer graphene and graphite are simultaneously grown on a ∼100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(π) hybridization.

• OSTI ID: 22489343
• Journal Information: Applied Physics Letters, Vol. 108, Issue 4; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ELECTRONIC STRUCTURE
GRAPHENE
GRAPHITE
LAYERS
MICROSCOPY
NICKEL
POLYCRYSTALS
PROBES
THIN FILMS
WORK FUNCTIONS