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Title: Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy

Few layer graphene and graphite are simultaneously grown on a ∼100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(π) hybridization.
Authors:
 [1] ;  [2] ; ; ; ; ;  [1]
  1. Department of Physics, University of Basel, Klingelbergstrasse 82, CH-4056 Basel (Switzerland)
  2. (United States)
Publication Date:
OSTI Identifier:
22489343
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 108; Journal Issue: 4; Other Information: (c) 2016 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ELECTRONIC STRUCTURE; GRAPHENE; GRAPHITE; LAYERS; MICROSCOPY; NICKEL; POLYCRYSTALS; PROBES; THIN FILMS; WORK FUNCTIONS