skip to main content

SciTech ConnectSciTech Connect

Title: Submicron mass spectrometry imaging of single cells by combined use of mega electron volt time-of-flight secondary ion mass spectrometry and scanning transmission ion microscopy

In order to better understand biochemical processes inside an individual cell, it is important to measure the molecular composition at the submicron level. One of the promising mass spectrometry imaging techniques that may be used to accomplish this is Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS), using MeV energy heavy ions for excitation. MeV ions have the ability to desorb large intact molecules with a yield that is several orders of magnitude higher than conventional SIMS using keV ions. In order to increase the spatial resolution of the MeV TOF-SIMS system, we propose an independent TOF trigger using a STIM (scanning transmission ion microscopy) detector that is placed just behind the thin transmission target. This arrangement is suitable for biological samples in which the STIM detector simultaneously measures the mass distribution in scanned samples. The capability of the MeV TOF-SIMS setup was demonstrated by imaging the chemical composition of CaCo-2 cells.
Authors:
; ; ; ;  [1]
  1. Ruđer Bošković Institute, Bijenička cesta 54, 10000 Zagreb (Croatia)
Publication Date:
OSTI Identifier:
22489215
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 9; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CHEMICAL COMPOSITION; HEAVY IONS; ION MICROPROBE ANALYSIS; ION MICROSCOPY; KEV RANGE; MASS DISTRIBUTION; MASS SPECTROSCOPY; MEV RANGE; MOLECULES; SPATIAL RESOLUTION; TIME-OF-FLIGHT METHOD; TRANSMISSION