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Title: Secondary electron imaging of monolayer materials inside a transmission electron microscope

A scanning transmission electron microscope equipped with a backscattered and secondary electron detector is shown capable to image graphene and hexagonal boron nitride monolayers. Secondary electron contrasts of the two lightest monolayer materials are clearly distinguished from the vacuum level. A signal difference between these two materials is attributed to electronic structure differences, which will influence the escape probabilities of the secondary electrons. Our results show that the secondary electron signal can be used to distinguish between the electronic structures of materials with atomic layer sensitivity, enhancing its applicability as a complementary signal in the analytical microscope.
Authors:
; ;  [1]
  1. National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba 305-8565 (Japan)
Publication Date:
OSTI Identifier:
22489097
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BORON NITRIDES; ELECTRONIC STRUCTURE; ELECTRONS; GRAPHENE; MICROSCOPES; PROBABILITY; SENSITIVITY; SIGNALS; TRANSMISSION ELECTRON MICROSCOPY