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Title: Deviation from threshold model in ultrafast laser ablation of graphene at sub-micron scale

We investigate a method to measure ultrafast laser ablation threshold with respect to spot size. We use structured complex beams to generate a pattern of craters in CVD graphene with a single laser pulse. A direct comparison between beam profile and SEM characterization allows us to determine the dependence of ablation probability on spot-size, for crater diameters ranging between 700 nm and 2.5 μm. We report a drastic decrease of ablation probability when the crater diameter is below 1 μm which we interpret in terms of free-carrier diffusion.
Authors:
; ; ; ; ; ; ; ;  [1]
  1. Institut FEMTO-ST, UMR 6174 CNRS, Universite de Bourgogne Franche-Comte, 25030 Besançon Cedex (France)
Publication Date:
OSTI Identifier:
22489078
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 6; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ABLATION; BEAM PROFILES; BEAMS; CARRIERS; CHEMICAL VAPOR DEPOSITION; COMPARATIVE EVALUATIONS; CRATERS; DIFFUSION; GRAPHENE; LASERS; PROBABILITY; PULSES; SCANNING ELECTRON MICROSCOPY