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Title: Trace elemental analysis of school chalk using energy dispersive X-ray florescence spectroscopy (ED-XRF)

The present studies focus the quantitative analysis of elements in school chalk to ensure the safety of its use. The elements like Calcium (Ca), Aluminum (Al), Iron (Fe), Silicon (Si) and Chromium (Cr) were analyzed from settled chalk dust samples collected from five classrooms (CD-1) and also from another set of unused chalk samples collected from local market (CD-2) using Energy Dispersive X-Ray florescence(ED-XRF) spectroscopy. Presence of these elements in significant concentrations in school chalk confirmed that, it is an irritant and occupational hazard. It is suggested to use protective equipments like filtered mask for mouth, nose and chalk holders. This study also suggested using the advanced mode of techniques like Digital boards, marker boards and power point presentations to mitigate the occupational hazard for classroom chalk.
Authors:
 [1] ;  [2] ;  [3] ;  [4] ;  [5]
  1. Associate professor, Dept of Environmental Studies, GITAM Institute of Science, GITAM University, Visakhapatnam, A.P (India)
  2. Professor, Dept of Physics, GITAM Institute of Science, GITAM University, Visakhapatnam, A.P (India)
  3. Research Scholar, Dept of Environmental science, GITAM Institute of Science, GITAM University, Visakhapatnam, A.P (India)
  4. Research Scholar, Dept of Trace element research, UGC-DAE Consortium Centre, Kolkata centre India (India)
  5. Scientist-F, Dept of Trace element research, UGC-DAE Consortium Centre, Kolkata centre India (India)
Publication Date:
OSTI Identifier:
22488876
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1675; Journal Issue: 1; Conference: AMRP-2015: 4. national conference on advanced materials and radiation physics, Longowal (India), 13-14 Mar 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ABUNDANCE; ALUMINIUM; CALCITE; CALCIUM; CHROMIUM; CONCENTRATION RATIO; DUSTS; IRON; LIMESTONE; MULTI-ELEMENT ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; SAFETY; SILICON; X-RAY EMISSION ANALYSIS; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY