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Title: Effect of nickel seed layer on growth of α-V{sub 2}O{sub 5} nanostructured thin films

In this communication, we reported the role of Ni seed layer on the growth of vanadium pentoxide (α-V{sub 2}O{sub 5}) nanostructured thin films (NSTs) using plasma assisted sublimation process (PASP). Two different substrates, simple glass substrate and the Ni coated glass substrate (Ni thickness ∼ 100 nm) are employing in the present work. The influence of seed layer on structural, morphological, and vibrational properties have been studied systematically. The structural analysis divulged that both films deposited on simple glass as well as on Ni coated glass shown purely orthorhombic phase, no other phases are detected. The morphological studies of V{sub 2}O{sub 5} film deposited on both substrates are carried out by SEM, revealed that features of V{sub 2}O{sub 5} NSTs is completely modified in presence of Ni seed layer and the film possessing the excellent growth of nanorods (NRs) on Ni coated glass rather than simple glass. The HRTEM analysis of NRs is performed at very high magnification, shows very fine fringe pattern, which confirmed the single crystalline nature of nanorods. The vibrational study of NRs is performed using micro-Raman spectroscopy, which strongly support the XRD observations.
Authors:
; ; ; ;  [1]
  1. Thin film Laboratory, Department of Physics, Indian Institute of Technology Delhi-110016 (India)
Publication Date:
OSTI Identifier:
22488856
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1675; Journal Issue: 1; Conference: AMRP-2015: 4. national conference on advanced materials and radiation physics, Longowal (India), 13-14 Mar 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; GLASS; LAYERS; MONOCRYSTALS; NANOSTRUCTURES; NICKEL; ORTHORHOMBIC LATTICES; PLASMA; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SUBLIMATION; SUBSTRATES; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM OXIDES; X-RAY DIFFRACTION