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Title: Effect of thermal annealing on structural and optical properties of In{sub 2}S{sub 3} thin films

There is a highly need of an alternate of toxic materials CdS for solar cell applications and indium sulfide is found the most suitable candidate to replace CdS due to its non-toxic and environmental friendly nature. In this paper, the effect of thermal annealing on the structural and optical properties of indium sulfide (In{sub 2}S{sub 3}) thin films is undertaken. The indium sulfide thin films of 121 nm were deposited on glass substrates employing thermal evaporation method. The films were subjected to the X-ray diffractometer and UV-Vis spectrophotometer respectively for structural and optical analysis. The XRD pattern show that the as-deposited thin film was amorphous in nature and crystallinity is found to be varied with annealing temperature. The optical analysis reveals that the optical band gap is varied with annealing. The optical parameters like absorption coefficient, extinction coefficient and refractive index were calculated. The results are in good agreement with available literature.
Authors:
 [1]
  1. Department of Physics, Mohanlal Sukhadia University, Udaipur-313001 (India)
Publication Date:
OSTI Identifier:
22488829
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1675; Journal Issue: 1; Conference: AMRP-2015: 4. national conference on advanced materials and radiation physics, Longowal (India), 13-14 Mar 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION; AMORPHOUS STATE; ANNEALING; CADMIUM SULFIDES; ENERGY GAP; EVAPORATION; GLASS; INDIUM SULFIDES; REFRACTIVE INDEX; SOLAR CELLS; SPECTROPHOTOMETRY; SUBSTRATES; THIN FILMS; TOXIC MATERIALS; TOXICITY; X-RAY DIFFRACTION