skip to main content

SciTech ConnectSciTech Connect

Title: Optical and structural properties of indium doped bismuth selenide thin films

In: Bi{sub 2}Se{sub 3} crystals were grown by Bridgman method at a growth velocity of 0.5cm/h with temperature gradient of 650 C/cm in our laboratory. The thin films of In:Bi{sub 2}se{sub 3} were grown on amorphous substrate (glass) at a room temperature under a pressure of 10{sup −4}Pa by thermal evaporation technique. Thin film were deposited at various thicknesses and optical absorption spectrum of such thin films, obtain in wave no. range 300 to 2600 cm{sup −1}. The optical energy gap calculated from this data were found to be inverse function of square of thickness, particularly for thickness about 1800 Å or less. This dependence is explained in terms of quantum size effect. For thicker films, the bandgap is found to be independent of film thickness. For the surface stud of the as grown thin film by using AFM, which shows continuous film with some step height and surface roughness found in terms of few nm and particle size varies with respect to thickness.
Authors:
; ; ; ;  [1] ;  [2]
  1. Department of Physics, School of Science, Gujarat University, Ahmedabad, Gujarat (India)
  2. BITS Edu Campus, Varnama, Vadodara, Gujarat (India)
Publication Date:
OSTI Identifier:
22488781
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1675; Journal Issue: 1; Conference: AMRP-2015: 4. national conference on advanced materials and radiation physics, Longowal (India), 13-14 Mar 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTRA; ATOMIC FORCE MICROSCOPY; BISMUTH; BISMUTH SELENIDES; CRYSTAL GROWTH; CRYSTALS; DOPED MATERIALS; ENERGY GAP; EVAPORATION; GLASS; INDIUM; PARTICLE SIZE; ROUGHNESS; SUBSTRATES; SURFACES; TEMPERATURE GRADIENTS; TEMPERATURE RANGE 0273-0400 K; THICKNESS; THIN FILMS