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Title: Characterization of gypsum crystals exposed to a high CO{sub 2} concentration fog using x-ray

In Chihuahua State, a little town called Naica has the largest gypsum single crystals in the world. The growth of these structures has been described as a long and stable process developed over thousands of years. Due to the change in the environmental conditions, these crystals could suffer alterations on their surface. In this project we study the cause of possible deterioration of the giant crystals and intend to suggest measures for their preservation. For this sake, our first experiment consists on several gypsum crystals that have been subjected in a climate chamber to a fog at high CO{sub 2} concentration and 51 °C for a period of time of six months, extracting two crystals every 15 days. Then the crystals have been characterized through Grazing Incidence X-Ray Diffraction using a diffractometer PanAlytical X’PertPro with two different detectors; Xe-filled proportional detector and a Pixel 3D detector. The results were compared to determine which technique is the most suitable to study the degradation of gypsum single crystals. In the two cases, we have identified only the gypsum phase, but with different crystal plane orientations.
Authors:
; ; ; ;  [1]
  1. Centro de Investigación en Materiales Avanzados (CIMAV), Miguel de Cervantes 120, Chihuahua, Chih. 31136 (Mexico)
Publication Date:
OSTI Identifier:
22488695
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1671; Journal Issue: 1; Conference: 11. international symposium on radiation physics, Ciudad Juarez (Mexico), 4-6 Mar 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ABUNDANCE; CARBON DIOXIDE; CLIMATES; COMPARATIVE EVALUATIONS; CONCENTRATION RATIO; GYPSUM; MONOCRYSTALS; ORIENTATION; PRESERVATION; SURFACES; X-RAY DIFFRACTION