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Title: X-ray absorption and resonant inelastic x-ray scattering (RIXS) show the presence of Cr{sup +} at the surface and in the bulk of CrF{sub 2}

X-Ray absorption and resonant inelastic x-ray scattering (RIXS) spectra of CrF{sub 2} recorded at the chromium L{sub 2,3} are presented. An atomic multiplet crystal field calculation is compared with the experimental data. Experiment and theory are in agreement once the calculation includes three chromium oxidation states, namely Cr{sup +}, Cr{sup 2+}, and Cr{sup 3+}. X-Ray absorption allows a direct determination of the surface oxidation, while the RIXS spectra shows the presence of these three oxidation states in the sample bulk. To give a quantitative interpretation of the RIXS data the effect of the incomming and outgoing photon penetration depth and self-absorption must be considered. For the much simpler case of MnF{sub 2}, with only one metal oxidation state, the measured RIXS spectra relative intensities are found to be proportional to the square of the sample attenuation length.
Authors:
 [1] ;  [2] ;  [3] ; ;  [2]
  1. Instituto de Ciencias Nucleares, UNAM, 04510 México DF, México (Mexico)
  2. The Advanced Light Source, Lawrence Berkeley Laboratory, Berkeley, CA 94720 (United States)
  3. (Switzerland)
Publication Date:
OSTI Identifier:
22488680
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1671; Journal Issue: 1; Conference: 11. international symposium on radiation physics, Ciudad Juarez (Mexico), 4-6 Mar 2015; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CHROMIUM; CHROMIUM FLUORIDES; CHROMIUM IONS; COMPARATIVE EVALUATIONS; CRYSTAL FIELD; MANGANESE FLUORIDES; OXIDATION; PENETRATION DEPTH; PHOTONS; SELF-ABSORPTION; SURFACES; VALENCE; X RADIATION; X-RAY DIFFRACTION; X-RAY SPECTRA