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Title: Characteristics of different frequency ranges in scanning electron microscope images

We demonstrate a new approach to characterize the frequency range in general scanning electron microscope (SEM) images. First, pure frequency images are generated from low frequency to high frequency, and then, the magnification of each type of frequency image is implemented. By comparing the edge percentage of the SEM image to the self-generated frequency images, we can define the frequency ranges of the SEM images. Characterization of frequency ranges of SEM images benefits further processing and analysis of those SEM images, such as in noise filtering and contrast enhancement.
Authors:
; ; ; ;  [1]
  1. Faculty of Engineering and Technology, Multimedia University, 75450 Melaka (Malaysia)
Publication Date:
OSTI Identifier:
22488627
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1669; Journal Issue: 1; Conference: SCMSM 2014: 23. scientific conference of Microscopy Society Malaysia, Tronoh (Malaysia), 10-12 Dec 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; COMPARATIVE EVALUATIONS; FILTERS; FREQUENCY DEPENDENCE; FREQUENCY RANGE; IMAGE PROCESSING; IMAGES; NOISE; SCANNING ELECTRON MICROSCOPY