skip to main content

SciTech ConnectSciTech Connect

Title: Characterization of Cr-rich Cr-Sb multilayer films: Syntheses of a new metastable phase using modulated elemental reactants

The new metastable compound Cr{sub 1+x}Sb with x up to 0.6 has been prepared via a thin film approach using modulated elemental reactants and investigated by in-situ X-ray reflectivity, X-ray diffraction, differential scanning calorimetry, energy dispersive X-ray analysis as well as transmission electron microscopy and atomic force microscopy. The new Cr-rich antimonide crystallizes in a structure related to the Ni{sub 2}In-type structure, where the crystallographic position (1/3, 2/3, 3/4) is partially occupied by excess Cr. The elemental layers of the pristine material interdiffused significantly before Cr{sub 1+x}Sb crystallized. A change in the activation energy was observed for the diffusion process when crystal growth starts. First-principles electronic structure calculations provide insight into the structural stability, magnetic properties and resistivity of Cr{sub 1+x}Sb. - Graphical abstract: 1 amorphous multilayered film 2 interdiffused amorphous film 3 metastable crystalline phase 4 thermodynamic stable phase (and by-product). - Highlights: • Interdiffusion of amorphous Cr and Sb occurs before crystallization. • Crystallization of a new metastable phase Cr{sub 1.6}Sb in Ni{sub 2}In-type structure. • The new Cr-rich phase shows half-metallic behavior.
Authors:
 [1] ; ; ;  [2] ;  [3] ;  [4] ; ;  [5] ;  [1] ; ; ;  [5] ;  [4] ;  [3] ;  [2] ;  [1]
  1. Institute of Inorganic Chemistry, Christian-Albrechts-University of Kiel, Max-Eyth-Str. 2, 24118 Kiel (Germany)
  2. Department of Chemistry, Ludwig-Maximilians-University Munich, Butenandtstr. 5-13, D-81377 München (Germany)
  3. Department of Chemistry and Materials Science Institute, University of Oregon, 373 Klamath Hall, Eugene, OR 97403 (United States)
  4. Institute for Materials Science, Christian-Albrechts-University of Kiel, Kaiserstr. 2, 24118 Kiel (Germany)
  5. Fraunhofer Institute for Physical Measurement Techniques IPM, Thermoelectric Systems, Heidenhofstraße 8, 79110 Freiburg (Germany)
Publication Date:
OSTI Identifier:
22486815
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Solid State Chemistry; Journal Volume: 230; Other Information: Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ATOMIC FORCE MICROSCOPY; CALORIMETRY; CRYSTAL GROWTH; CRYSTALLIZATION; DENSITY OF STATES; DIFFUSION; ELECTRONIC STRUCTURE; LAYERS; MAGNETIC PROPERTIES; PHASE STABILITY; REFLECTIVITY; SYNTHESIS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RADIATION; X-RAY DIFFRACTION