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Title: Raman spectroscopy measurement of bilayer graphene's twist angle to boron nitride

When graphene is placed on hexagonal boron nitride with a twist angle, new properties develop due to the resulting moiré superlattice. Here, we report a method using Raman spectroscopy to make rapid, non-destructive measurements of the twist angle between bilayer graphene and hexagonal boron nitride. The lattice orientation is determined by using flakes with both bilayer and monolayer regions, and using the known Raman signature for the monolayer to measure the twist angle of the entire flake. The widths of the second order Raman peaks are found to vary linearly in the superlattice period and are used to determine the twist angle. The results are confirmed by using transport measurements to infer the superlattice period by the charge density required to reach the secondary resistance peaks. Small twist angles are also found to produce a significant modification of the first order Raman G band peak.
Authors:
; ; ; ; ; ;  [1] ; ;  [2]
  1. Department of Physics and Astronomy, University of California, Riverside, California 92521 (United States)
  2. Advanced Materials Laboratory, National Institute for Materials Science, Tsukuba, Ibaraki 305-0044 (Japan)
Publication Date:
OSTI Identifier:
22486353
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 3; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BORON NITRIDES; CHARGE DENSITY; GRAPHENE; LAYERS; ORIENTATION; PEAKS; RAMAN SPECTROSCOPY; SUPERLATTICES