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Title: Interfacial thermal degradation in inverted organic solar cells

The efficiency of organic photovoltaic (OPV) solar cells is constantly improving; however, the lifetime of the devices still requires significant improvement if the potential of OPV is to be realised. In this study, several series of inverted OPV were fabricated and thermally aged in the dark in an inert atmosphere. It was demonstrated that all of the devices undergo short circuit current-driven degradation, which is assigned to morphology changes in the active layer. In addition, a previously unreported, open circuit voltage-driven degradation mechanism was observed that is highly material specific and interfacial in origin. This mechanism was specifically observed in devices containing MoO{sub 3} and silver as hole transporting layers and electrode materials, respectively. Devices with this combination were among the worst performing devices with respect to thermal ageing. The physical origins of this mechanism were explored by Rutherford backscattering spectrometry and atomic force microscopy and an increase in roughness with thermal ageing was observed that may be partially responsible for the ageing mechanism.
Authors:
; ; ;  [1]
  1. University of Bordeaux, CNRS, Bordeaux INP, IMS, UMR 5218, F-33405 Talence (France)
Publication Date:
OSTI Identifier:
22486317
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 26; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMIC FORCE MICROSCOPY; CURRENTS; EFFICIENCY; ELECTRIC POTENTIAL; ELECTRICAL FAULTS; ELECTRODES; INERT ATMOSPHERE; MOLYBDENUM OXIDES; ORGANIC SOLAR CELLS; PHOTOVOLTAIC EFFECT; ROUGHNESS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILVER; THERMAL DEGRADATION