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Title: Current fluctuation of electron and hole carriers in multilayer WSe{sub 2} field effect transistors

Two-dimensional materials have outstanding scalability due to their structural and electrical properties for the logic devices. Here, we report the current fluctuation in multilayer WSe{sub 2} field effect transistors (FETs). In order to demonstrate the impact on carrier types, n-type and p-type WSe{sub 2} FETs are fabricated with different work function metals. Each device has similar electrical characteristics except for the threshold voltage. In the low frequency noise analysis, drain current power spectral density (S{sub I}) is inversely proportional to frequency, indicating typical 1/f noise behaviors. The curves of the normalized drain current power spectral density (NS{sub I}) as a function of drain current at the 10 Hz of frequency indicate that our devices follow the carrier number fluctuation with correlated mobility fluctuation model. This means that current fluctuation depends on the trapping-detrapping motion of the charge carriers near the channel interface. No significant difference is observed in the current fluctuation according to the charge carrier type, electrons and holes that occurred in the junction and channel region.
Authors:
; ; ; ;  [1] ; ;  [2] ;  [1] ;  [3]
  1. School of Electrical Engineering, Korea University, Seoul 02481 (Korea, Republic of)
  2. Department of Materials Science and Engineering, Korea University, Seoul 02481 (Korea, Republic of)
  3. (France)
Publication Date:
OSTI Identifier:
22486234
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 24; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CARRIERS; CHARGE CARRIERS; CURRENTS; ELECTRIC POTENTIAL; ELECTRICAL PROPERTIES; FIELD EFFECT TRANSISTORS; FLUCTUATIONS; HOLES; LAYERS; METALS; NOISE; SPECTRAL DENSITY; TWO-DIMENSIONAL SYSTEMS; WORK FUNCTIONS