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Title: Imaging interfacial electrical transport in graphene–MoS{sub 2} heterostructures with electron-beam-induced-currents

Heterostructure devices with specific and extraordinary properties can be fabricated by stacking two-dimensional crystals. Cleanliness at the inter-crystal interfaces within a heterostructure is crucial for maximizing device performance. However, because these interfaces are buried, characterizing their impact on device function is challenging. Here, we show that electron-beam induced current (EBIC) mapping can be used to image interfacial contamination and to characterize the quality of buried heterostructure interfaces with nanometer-scale spatial resolution. We applied EBIC and photocurrent imaging to map photo-sensitive graphene-MoS{sub 2} heterostructures. The EBIC maps, together with concurrently acquired scanning transmission electron microscopy images, reveal how a device's photocurrent collection efficiency is adversely affected by nanoscale debris invisible to optical-resolution photocurrent mapping.
Authors:
; ; ;  [1] ; ;  [2] ;  [3]
  1. Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095 (United States)
  2. Department of Electrical Engineering, University of Southern California, Los Angeles, California 90089 (United States)
  3. Center for Electron Microscopy and Microanalysis, University of Southern California, Los Angeles, California 90089 (United States)
Publication Date:
OSTI Identifier:
22486164
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 107; Journal Issue: 22; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CRYSTALS; GRAPHENE; INTERFACES; MOLYBDENUM SULFIDES; NANOSTRUCTURES; PERFORMANCE; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; TRANSMISSION ELECTRON MICROSCOPY; TWO-DIMENSIONAL SYSTEMS